• Fabrication of a single-crystal giant ma

    From ScienceDaily@1337:3/111 to All on Thu Aug 27 21:30:36 2020
    Fabrication of a single-crystal giant magnetoresistive device on a polycrystalline film
    Technique may promote practical use of high-performance magnetoresistive devices comprising half-metallic heusler alloys

    Date:
    August 27, 2020
    Source:
    National Institute for Materials Science, Japan
    Summary:
    Engineers have succeeded in fabricating a giant magnetoresistive
    (GMR) device comprising single-crystal Heusler alloys on an
    practical silicon substrate. The team demonstrated for the first
    time that a single-crystal magnetoresistive device can be bonded
    onto the surface of a polycrystalline electrode using a wafer
    bonding technique.



    FULL STORY ==========================================================================
    NIMS and AIST have jointly succeeded in fabricating a giant
    magnetoresistive (GMR) device comprising single-crystal Heusler alloys
    on an practical silicon substrate. The team demonstrated for the
    first time that a single-crystal magnetoresistive device can be bonded
    onto the surface of a polycrystalline electrode using a wafer bonding technique. The fabrication of high-performance single-crystal devices
    has proven challenging, and these results may provide new guidance in
    the development of larger capacity hard disk drives (HDDs).


    ==========================================================================
    Some Heusler alloys (e.g., Co2MnSi) are known to possess half metallic property?substances that act as conductors to electrons of only one spin orientation when their atoms are in an orderly arrangement. In previous research, a high-quality GMR device was fabricated using half-metallic
    Heusler alloys. This device was reported to exhibit an extremely large magnetoresistance ratio, a characteristic vital to the development of
    hard disk read heads compatible with HDDs with nearly five times the
    recording density of current HDDs. However, the fabrication of this GMR
    device required the use of a heat-resistant single-crystal magnesium
    oxide (MgO) substrate with an appropriate lattice structure, which is considerably more costly than using the industrially established small
    MgO substrate. In addition, HDD read heads need to be fabricated on a polycrystalline magnetic shield, despite the fact that it is impossible to
    grow a single-crystal device directly on the surface of a polycrystalline
    film with crystal grains having various lattice orientations.

    Moreover, Heusler alloys have to be annealed at a temperature of at least 300DEGC to form an orderly atomic ordering. However, this annealing
    process also damages the magnetic shield layer. These issues have
    prevented practical applications of GMR devices comprising single-crystal Heusler alloys.

    This research team deposited a NiAl/CoFe buffer layer on the surface of
    a conventional, inexpensive silicon substrate and discovered that the
    substrate acquired significantly increased heat resistance and a smoother surface. The team then fabricated a GMR device comprising single-crystal Heusler alloys on the silicon substrate and confirmed that the device
    performs comparably to the GMR device grown on the MgO substrate. The
    team also grew a polycrystalline electrode film on the surface of another substrate and fabricated a GMR film device comprising single-crystal
    Heusler alloys on it. The team subsequently bonded the fabricated GMR
    film device onto a wafer using the latest three- dimensional integration technology. Through these processes, the team formed an extremely
    smooth, defect-free bonded interface between the polycrystalline and
    single crystal films by optimizing wafer bonding conditions. The team
    also confirmed that bonding the fabricated GMR film device onto a wafer
    did not negatively affect the device's magnetoresistive performance. The techniques the team developed are expected to eliminate the need to grow
    a single-crystal magnetoresistive device directly on a polycrystalline electrode film and completely resolve the damage issue caused by high-temperature treatment.

    These techniques are applicable not only to the fabrication of
    GMR devices comprising single-crystal Heusler alloys but also for
    various other purposes, such as the integration of single-crystal
    tunneling magnetoresistance devices - - another potentially promising high-performance technology -- onto a heat- susceptible circuit board. The
    use of these techniques may promote practical use of high-performance single-crystal spintronic devices, thereby potentially contributing
    to the development of larger capacity HDDs and magnetoresistive random
    access memory.


    ========================================================================== Story Source: Materials provided by National_Institute_for_Materials_Science,_Japan. Note: Content may be
    edited for style and length.


    ========================================================================== Journal Reference:
    1. Jiamin Chen, Yuya Sakuraba, Kay Yakushiji, Yuichi Kurashima, Naoya
    Watanabe, Jun Liu, Songtian Li, Akio Fukushima, Hideki
    Takagi, Katsuya Kikuchi, Shinji Yuasa, Kazuhiro Hono. Fully
    epitaxial giant magnetoresistive devices with half-metallic
    Heusler alloy fabricated on poly-crystalline electrode using
    three-dimensional integration technology. Acta Materialia, 2020;
    DOI: 10.1016/j.actamat.2020.04.002 ==========================================================================

    Link to news story: https://www.sciencedaily.com/releases/2020/08/200827101828.htm

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